News Probing hidden materials via atomic force microscopySeptember 10, 2023 Schematic modalities where a probe (p), a sample (s), or both are excited by signals…
News Atomic Force Microscopy (AFM) in NanoscienceAugust 16, 2023 Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is…
News Achieving the goal with UV-assisted atomic layer depositionAugust 15, 2023 Research-related image. Credit: POSTECH In 2004, the public first became acquainted with graphene- a remarkably…